The Advanced Microscopy Facility houses a Scanning Electron Microscope (SEM), a Focused Ion Beam (FIB), a Transmission Electron Microscope (TEM) and a Scanning Transmission Electron Holography Microscope (STEHM) and other sample preparation instruments. In May 2012 we became home to the highest resolution microscope in the world, the Hitachi HF-3300V (STEHM).


The STEHM is ready in its high-resolution imaging and diffraction mode at 300 kV, 200 kV and 60 kV. The 300 kV works with thick specimens and produces the highest spatial resolution imaging. The 60 kV mode is good for beam sensitive specimens and provides more contrast, while achieving sub-Angstrom spatial resolution.

The specimen holders available include a single tilt holder, double tilt holder, heating holder (up to 1500 C), cryo LN2 holder, and 360 degree tomography holder.

For analytical electron microscopy, i.e., determining compositions and the state of atoms and ions in materials, the Gatan electron energy loss spectrometer (EELS) and Gatan Imaging Filter (GIF) is available. There is also a Bruker energy dispersive spectrometer (EDS) for elemental analysis using X-ray signals.

The TEM is currently being installed in our facility after having been moved from the Electron Microscopy lab at UVic biology.