Available tools
Advanced Microscopy Facility (AMF)
- Hitachi S-4800 field emission scanning electron microscope (FESEM) with BSD and EDX (current status)
- Hitachi FB-2100 focused ion beam (FIB) with W deposition and nanomanipulator (current status)
- Hitachi H-7000 transmission electron microscope (TEM) with digital imaging (current status)
- HF-3300V scanning transmission electron holography microscope (STEHM) with aberration correction, EELS/EFTEM, EDX, holography and tomography (current status)
- Sample preparation (C and Au/Pd coating, ion milling, UV and plasma cleaning, cryo-plunge)
Facility for Imaging, Photonics and Spectroscopy (FIPS)
- Agilent 5500 atomic force microscope (AFM) (current status)
- Cytoviva dark field hyperspectral microscope (current status)
- Empyrean, PANalytical small angle X-ray scattering (SAXS) system (current status)
- Renishaw inVia microRaman system (current status)
- Scanning near-field optical microscopy (SNOM) (coming soon)
- Single Quantum superconductor single photon counting (SCSPC) system (current status)
- Tip-enhanced Raman scattering (TERS) microscope (current status)
- Transmission optical microscope (a few are available)
- Zeiss laser scanning confocal fluorescence microscope (current status)
Nanofabrication Facility (Nanofab)
- AlphRaith 50 electron beam lithography system (EBL) (current status)
- Angstrom engineering glove-box electron beam evaporator (current status)
- Mantis® QUBE sputter deposition system (current status)
- SE variable angle spectral ellipsometer (VASE) (current status)
- OAI UV optical lithography system (current status)